抄録
Distinguishing photon arrival time and position is crucial for advancing quantum technology. However, capturing spatial and temporal information efficiently remains challenging. Here, we present a novel photon detection technique to achieve a significantly more efficient measurement of frequency-entangled biphoton than conventional photon detectors. We utilize a delay-line-anode single-photon detector (DLD), which consists of a position-sensitive delay-line anode sensor behind a microchannel plate. Biphotons are obtained from the decay of biexcitons in the copper chloride semiconductor crystal. Two DLDs are coupled with a grating spectrometer exit to measure the joint spectral distributions of the biphoton. The resulting non-scanning process requires only a few minutes to obtain a temporally and spectrally resolved image, much quicker than the scanning biphoton frequency measurements such as monochromator or Fourier spectroscopy. Our technique paves the way for all experiments in multi-mode quantum science requiring coincidence measurement.